The AVTE-3000 is a fully-automated, high performance high volume test and programming production capable of testing a large variety of Flash memory devices.

The AVTE-3000 offers the highest throughput in testing and programming Flash memory devices of any system on the market. The system can process up to tens of thousands of devices per hour. For example: the AVTE-3000 can program and verify 16,000 typical uSD cards with 10MB/s read & write speeds per hour.

The system can be configured for a variety of devices by swapping out the load boards. This changeover process can be performed within 10 minutes. Indexing time is also extremely low. The time it takes to replace a test or pro- gramming tray and feed it to the test and programming load board takes less than 10 seconds.

The AVTE-3000 is capable of testing all current and future memory card and storage devices including UHS-SD cards (104-208MHz).


Front interior view of the AVTE-3000


Above: Front interior view of the AVTE-3000

Screenshot of the AVTE-3000 in action


Above: Actual screenshot of the AVTE-3000 in action


Above: Rear interior view of the AVTE-3000


Above: Rear interior view of the AVTE-3000


Configurations:


The AVTE-3000 contains 8 test channels, each of them containing a load plate populated with test sockets.

Typical configurations include:
uSD cards: 8 channels with 128 sockets per test channel (1,024 test sockets max)
NAND chips: 8 channels with 96 sockets per test channel (768 test sockets max)

Devices Supported:

SD or uSD cards
eMMC devices
eMCP or Managed NAND devices
SATA SSD devices
NAND, NOR devices

Packages Supported:

Virtually all Flash memory card packages
TSOP, TSSOP
BGA, microBGA

Features:

Windows Vista or Windows 7 operating systems supported


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